13#ifndef ZEPHYR_TESTSUITE_ZTEST_TEST_H_
14#define ZEPHYR_TESTSUITE_ZTEST_TEST_H_
20#if defined(CONFIG_USERSPACE)
21#define __USERSPACE_FLAGS (K_USER)
23#define __USERSPACE_FLAGS (0)
56#define __ZTEST_EXPECT(_suite_name, _test_name, expectation) \
57 static const STRUCT_SECTION_ITERABLE( \
58 ztest_expected_result_entry, \
59 UTIL_CAT(UTIL_CAT(z_ztest_expected_result_, _suite_name), _test_name)) = { \
60 .test_suite_name = STRINGIFY(_suite_name), \
61 .test_name = STRINGIFY(_test_name), \
62 .expected_result = expectation, \
78#define ZTEST_EXPECT_FAIL(_suite_name, _test_name) \
79 __ZTEST_EXPECT(_suite_name, _test_name, ZTEST_EXPECTED_RESULT_FAIL)
94#define ZTEST_EXPECT_SKIP(_suite_name, _test_name) \
95 __ZTEST_EXPECT(_suite_name, _test_name, ZTEST_EXPECTED_RESULT_SKIP)
109#define ZTEST_TEST_COUNT (_ztest_unit_test_list_end - _ztest_unit_test_list_start)
141typedef void *(*ztest_suite_setup_t)(void);
202#define ZTEST_SUITE_COUNT (_ztest_suite_node_list_end - _ztest_suite_node_list_start)
218#define ZTEST_SUITE(SUITE_NAME, PREDICATE, setup_fn, before_fn, after_fn, teardown_fn) \
219 struct ztest_suite_stats UTIL_CAT(z_ztest_suite_node_stats_, SUITE_NAME); \
220 static const STRUCT_SECTION_ITERABLE(ztest_suite_node, \
221 UTIL_CAT(z_ztest_test_node_, SUITE_NAME)) = { \
222 .name = STRINGIFY(SUITE_NAME), \
223 .setup = (setup_fn), \
224 .before = (before_fn), \
225 .after = (after_fn), \
226 .teardown = (teardown_fn), \
227 .predicate = PREDICATE, \
228 .stats = &UTIL_CAT(z_ztest_suite_node_stats_, SUITE_NAME), \
245int z_impl_ztest_run_test_suites(
const void *
state);
248 return z_impl_ztest_run_test_suites(
state);
253#include <syscalls/ztest_test_new.h>
276int z_ztest_run_test_suite(
const char *
name);
289#ifdef CONFIG_USERSPACE
290#define ZTEST_DMEM K_APP_DMEM(ztest_mem_partition)
291#define ZTEST_BMEM K_APP_BMEM(ztest_mem_partition)
292#define ZTEST_SECTION K_APP_DMEM_SECTION(ztest_mem_partition)
297#define ZTEST_SECTION .data
334#define Z_TEST(suite, fn, t_options, use_fixture) \
335 struct ztest_unit_test_stats z_ztest_unit_test_stats_##suite##_##fn; \
336 static void _##suite##_##fn##_wrapper(void *data); \
337 static void suite##_##fn( \
338 COND_CODE_1(use_fixture, (struct suite##_fixture *fixture), (void))); \
339 static STRUCT_SECTION_ITERABLE(ztest_unit_test, z_ztest_unit_test_##suite##_##fn) = { \
340 .test_suite_name = STRINGIFY(suite), \
341 .name = STRINGIFY(fn), \
342 .test = (_##suite##_##fn##_wrapper), \
343 .thread_options = t_options, \
344 .stats = &z_ztest_unit_test_stats_##suite##_##fn \
346 static void _##suite##_##fn##_wrapper(void *data) \
348 COND_CODE_1(use_fixture, (suite##_##fn((struct suite##_fixture *)data);), \
349 (ARG_UNUSED(data); suite##_##fn();)) \
351 static inline void suite##_##fn( \
352 COND_CODE_1(use_fixture, (struct suite##_fixture *fixture), (void)))
354#define Z_ZTEST(suite, fn, t_options) Z_TEST(suite, fn, t_options, 0)
355#define Z_ZTEST_F(suite, fn, t_options) Z_TEST(suite, fn, t_options, 1)
365#define Z_TEST_SKIP_IFDEF(config) COND_CODE_1(config, (ztest_test_skip()), ())
376#define Z_TEST_SKIP_IFNDEF(config) COND_CODE_1(config, (), (ztest_test_skip()))
387#define ZTEST(suite, fn) Z_ZTEST(suite, fn, 0)
398#define ZTEST_USER(suite, fn) Z_ZTEST(suite, fn, K_USER)
409#define ZTEST_F(suite, fn) Z_ZTEST_F(suite, fn, 0)
420#define ZTEST_USER_F(suite, fn) Z_ZTEST_F(suite, fn, K_USER)
434struct ztest_test_rule {
458#define ZTEST_RULE(name, before_each_fn, after_each_fn) \
459 static STRUCT_SECTION_ITERABLE(ztest_test_rule, z_ztest_test_rule_##name) = { \
460 .before_each = (before_each_fn), \
461 .after_each = (after_each_fn), \
464extern struct ztest_test_rule _ztest_test_rule_list_start[];
465extern struct ztest_test_rule _ztest_test_rule_list_end[];
490#define ztest_run_test_suite(suite) z_ztest_run_test_suite(STRINGIFY(suite))
void ztest_test_pass(void)
Pass the currently running test.
void(* ztest_rule_cb)(const struct ztest_unit_test *test, void *data)
Test rule callback function signature.
Definition: ztest_test_new.h:431
void ztest_simple_1cpu_after(void *data)
A 'after' function to use in test suites that just need to stop 1cpu.
void ztest_simple_1cpu_before(void *data)
A 'before' function to use in test suites that just need to start 1cpu.
void ztest_test_fail(void)
Fail the currently running test.
void ztest_test_skip(void)
Skip the current test.
state
Definition: http_parser_state.h:29
#define bool
Definition: stdbool.h:13
__UINT32_TYPE__ uint32_t
Definition: stdint.h:90
Memory Partition.
Definition: mem_domain.h:55
Structure for architecture specific APIs.
Definition: ztest_test_new.h:496
void(* run_all)(const void *state)
Definition: ztest_test_new.h:497
bool(* should_suite_run)(const void *state, struct ztest_suite_node *suite)
Definition: ztest_test_new.h:498
bool(* should_test_run)(const char *suite, const char *test)
Definition: ztest_test_new.h:499
A single expectation entry allowing tests to fail/skip and be considered passing.
Definition: ztest_test_new.h:47
const char * test_suite_name
Definition: ztest_test_new.h:48
enum ztest_expected_result expected_result
Definition: ztest_test_new.h:50
const char * test_name
Definition: ztest_test_new.h:49
Definition: ztest_test_deprecated.h:48
const ztest_suite_before_t before
Definition: ztest_test_new.h:185
const ztest_suite_setup_t setup
Definition: ztest_test_new.h:182
struct ztest_suite_stats *const stats
Definition: ztest_test_new.h:197
const ztest_suite_after_t after
Definition: ztest_test_new.h:188
struct unit_test * suite
Definition: ztest_test_deprecated.h:52
const char *const name
Definition: ztest_test_new.h:179
const char * name
Definition: ztest_test_deprecated.h:50
const ztest_suite_teardown_t teardown
Definition: ztest_test_new.h:191
const ztest_suite_predicate_t predicate
Definition: ztest_test_new.h:194
Definition: ztest_test_deprecated.h:35
uint32_t skip_count
Definition: ztest_test_deprecated.h:39
uint32_t fail_count
Definition: ztest_test_deprecated.h:41
uint32_t run_count
Definition: ztest_test_deprecated.h:37
Definition: ztest_test_new.h:123
uint32_t run_count
Definition: ztest_test_new.h:125
uint32_t pass_count
Definition: ztest_test_new.h:131
uint32_t skip_count
Definition: ztest_test_new.h:127
uint32_t duration_worst_ms
Definition: ztest_test_new.h:133
uint32_t fail_count
Definition: ztest_test_new.h:129
Definition: ztest_test_new.h:97
const char * name
Definition: ztest_test_new.h:99
struct ztest_unit_test_stats *const stats
Definition: ztest_test_new.h:104
void(* test)(void *data)
Definition: ztest_test_new.h:100
uint32_t thread_options
Definition: ztest_test_new.h:101
const char * test_suite_name
Definition: ztest_test_new.h:98
static fdata_t data[2]
Definition: test_fifo_contexts.c:15
void *(* ztest_suite_setup_t)(void)
Definition: ztest_test_new.h:141
void(* ztest_suite_after_t)(void *fixture)
Definition: ztest_test_new.h:155
void ztest_run_all(const void *state)
void ztest_verify_all_test_suites_ran(void)
Fails the test if any of the registered tests did not run.
struct k_mem_partition ztest_mem_partition
void(* ztest_suite_teardown_t)(void *fixture)
Definition: ztest_test_new.h:162
int ztest_run_test_suites(const void *state)
void(* ztest_suite_before_t)(void *fixture)
Definition: ztest_test_new.h:148
bool(* ztest_suite_predicate_t)(const void *global_state)
Definition: ztest_test_new.h:171
ztest_expected_result
The expected result of a test.
Definition: ztest_test_new.h:36
@ ZTEST_EXPECTED_RESULT_FAIL
Definition: ztest_test_new.h:37
@ ZTEST_EXPECTED_RESULT_SKIP
Definition: ztest_test_new.h:38