13#ifndef ZEPHYR_TESTSUITE_ZTEST_TEST_H_
14#define ZEPHYR_TESTSUITE_ZTEST_TEST_H_
21#if defined(CONFIG_USERSPACE)
22#define __USERSPACE_FLAGS (K_USER)
24#define __USERSPACE_FLAGS (0)
57#define __ZTEST_EXPECT(_suite_name, _test_name, expectation) \
58 static const STRUCT_SECTION_ITERABLE( \
59 ztest_expected_result_entry, \
60 UTIL_CAT(UTIL_CAT(z_ztest_expected_result_, _suite_name), _test_name)) = { \
61 .test_suite_name = STRINGIFY(_suite_name), \
62 .test_name = STRINGIFY(_test_name), \
63 .expected_result = expectation, \
79#define ZTEST_EXPECT_FAIL(_suite_name, _test_name) \
80 __ZTEST_EXPECT(_suite_name, _test_name, ZTEST_EXPECTED_RESULT_FAIL)
95#define ZTEST_EXPECT_SKIP(_suite_name, _test_name) \
96 __ZTEST_EXPECT(_suite_name, _test_name, ZTEST_EXPECTED_RESULT_SKIP)
110#define ZTEST_TEST_COUNT (_ztest_unit_test_list_end - _ztest_unit_test_list_start)
142typedef void *(*ztest_suite_setup_t)(void);
203#define ZTEST_SUITE_COUNT (_ztest_suite_node_list_end - _ztest_suite_node_list_start)
219#define ZTEST_SUITE(SUITE_NAME, PREDICATE, setup_fn, before_fn, after_fn, teardown_fn) \
220 struct ztest_suite_stats UTIL_CAT(z_ztest_suite_node_stats_, SUITE_NAME); \
221 static const STRUCT_SECTION_ITERABLE(ztest_suite_node, \
222 UTIL_CAT(z_ztest_test_node_, SUITE_NAME)) = { \
223 .name = STRINGIFY(SUITE_NAME), \
224 .setup = (setup_fn), \
225 .before = (before_fn), \
226 .after = (after_fn), \
227 .teardown = (teardown_fn), \
228 .predicate = PREDICATE, \
229 .stats = &UTIL_CAT(z_ztest_suite_node_stats_, SUITE_NAME), \
246int z_impl_ztest_run_test_suites(
const void *
state);
249 return z_impl_ztest_run_test_suites(
state);
254#include <syscalls/ztest_test_new.h>
277int z_ztest_run_test_suite(
const char *
name);
290#ifdef CONFIG_USERSPACE
291#define ZTEST_DMEM K_APP_DMEM(ztest_mem_partition)
292#define ZTEST_BMEM K_APP_BMEM(ztest_mem_partition)
293#define ZTEST_SECTION K_APP_DMEM_SECTION(ztest_mem_partition)
298#define ZTEST_SECTION .data
338#define Z_TEST(suite, fn, t_options, use_fixture) \
339 struct ztest_unit_test_stats z_ztest_unit_test_stats_##suite##_##fn; \
340 static void _##suite##_##fn##_wrapper(void *data); \
341 static void suite##_##fn( \
342 COND_CODE_1(use_fixture, (struct suite##_fixture *fixture), (void))); \
343 static STRUCT_SECTION_ITERABLE(ztest_unit_test, z_ztest_unit_test__##suite##__##fn) = { \
344 .test_suite_name = STRINGIFY(suite), \
345 .name = STRINGIFY(fn), \
346 .test = (_##suite##_##fn##_wrapper), \
347 .thread_options = t_options, \
348 .stats = &z_ztest_unit_test_stats_##suite##_##fn \
350 static void _##suite##_##fn##_wrapper(void *data) \
352 COND_CODE_1(use_fixture, (suite##_##fn((struct suite##_fixture *)data);), \
353 (ARG_UNUSED(data); suite##_##fn();)) \
355 static inline void suite##_##fn( \
356 COND_CODE_1(use_fixture, (struct suite##_fixture *fixture), (void)))
358#define Z_ZTEST(suite, fn, t_options) Z_TEST(suite, fn, t_options, 0)
359#define Z_ZTEST_F(suite, fn, t_options) Z_TEST(suite, fn, t_options, 1)
369#define Z_TEST_SKIP_IFDEF(config) COND_CODE_1(config, (ztest_test_skip()), ())
380#define Z_TEST_SKIP_IFNDEF(config) COND_CODE_1(config, (), (ztest_test_skip()))
391#define ZTEST(suite, fn) Z_ZTEST(suite, fn, 0)
402#define ZTEST_USER(suite, fn) Z_ZTEST(suite, fn, K_USER)
413#define ZTEST_F(suite, fn) Z_ZTEST_F(suite, fn, 0)
424#define ZTEST_USER_F(suite, fn) Z_ZTEST_F(suite, fn, K_USER)
438struct ztest_test_rule {
462#define ZTEST_RULE(name, before_each_fn, after_each_fn) \
463 static STRUCT_SECTION_ITERABLE(ztest_test_rule, z_ztest_test_rule_##name) = { \
464 .before_each = (before_each_fn), \
465 .after_each = (after_each_fn), \
468extern struct ztest_test_rule _ztest_test_rule_list_start[];
469extern struct ztest_test_rule _ztest_test_rule_list_end[];
494#define ztest_run_test_suite(suite) z_ztest_run_test_suite(STRINGIFY(suite))
void ztest_test_pass(void)
Pass the currently running test.
void ztest_skip_failed_assumption(void)
void(* ztest_rule_cb)(const struct ztest_unit_test *test, void *data)
Test rule callback function signature.
Definition: ztest_test_new.h:435
void ztest_simple_1cpu_after(void *data)
A 'after' function to use in test suites that just need to stop 1cpu.
void ztest_simple_1cpu_before(void *data)
A 'before' function to use in test suites that just need to start 1cpu.
void ztest_test_fail(void)
Fail the currently running test.
void ztest_test_skip(void)
Skip the current test.
state
Definition: parser_state.h:29
#define bool
Definition: stdbool.h:13
__UINT32_TYPE__ uint32_t
Definition: stdint.h:90
Memory Partition.
Definition: mem_domain.h:55
Structure for architecture specific APIs.
Definition: ztest_test_new.h:500
void(* run_all)(const void *state)
Definition: ztest_test_new.h:501
bool(* should_suite_run)(const void *state, struct ztest_suite_node *suite)
Definition: ztest_test_new.h:502
bool(* should_test_run)(const char *suite, const char *test)
Definition: ztest_test_new.h:503
A single expectation entry allowing tests to fail/skip and be considered passing.
Definition: ztest_test_new.h:48
const char * test_suite_name
Definition: ztest_test_new.h:49
enum ztest_expected_result expected_result
Definition: ztest_test_new.h:51
const char * test_name
Definition: ztest_test_new.h:50
Definition: ztest_test_deprecated.h:49
const ztest_suite_before_t before
Definition: ztest_test_new.h:186
const ztest_suite_setup_t setup
Definition: ztest_test_new.h:183
struct ztest_suite_stats *const stats
Definition: ztest_test_new.h:198
const ztest_suite_after_t after
Definition: ztest_test_new.h:189
struct unit_test * suite
Definition: ztest_test_deprecated.h:53
const char *const name
Definition: ztest_test_new.h:180
const char * name
Definition: ztest_test_deprecated.h:51
const ztest_suite_teardown_t teardown
Definition: ztest_test_new.h:192
const ztest_suite_predicate_t predicate
Definition: ztest_test_new.h:195
Definition: ztest_test_deprecated.h:36
uint32_t skip_count
Definition: ztest_test_deprecated.h:40
uint32_t fail_count
Definition: ztest_test_deprecated.h:42
uint32_t run_count
Definition: ztest_test_deprecated.h:38
Definition: ztest_test_new.h:124
uint32_t run_count
Definition: ztest_test_new.h:126
uint32_t pass_count
Definition: ztest_test_new.h:132
uint32_t skip_count
Definition: ztest_test_new.h:128
uint32_t duration_worst_ms
Definition: ztest_test_new.h:134
uint32_t fail_count
Definition: ztest_test_new.h:130
Definition: ztest_test_new.h:98
const char * name
Definition: ztest_test_new.h:100
struct ztest_unit_test_stats *const stats
Definition: ztest_test_new.h:105
void(* test)(void *data)
Definition: ztest_test_new.h:101
uint32_t thread_options
Definition: ztest_test_new.h:102
const char * test_suite_name
Definition: ztest_test_new.h:99
static fdata_t data[2]
Definition: test_fifo_contexts.c:15
void *(* ztest_suite_setup_t)(void)
Definition: ztest_test_new.h:142
void(* ztest_suite_after_t)(void *fixture)
Definition: ztest_test_new.h:156
void ztest_run_all(const void *state)
void ztest_verify_all_test_suites_ran(void)
Fails the test if any of the registered tests did not run.
struct k_mem_partition ztest_mem_partition
void(* ztest_suite_teardown_t)(void *fixture)
Definition: ztest_test_new.h:163
int ztest_run_test_suites(const void *state)
void(* ztest_suite_before_t)(void *fixture)
Definition: ztest_test_new.h:149
bool(* ztest_suite_predicate_t)(const void *global_state)
Definition: ztest_test_new.h:172
ztest_expected_result
The expected result of a test.
Definition: ztest_test_new.h:37
@ ZTEST_EXPECTED_RESULT_FAIL
Definition: ztest_test_new.h:38
@ ZTEST_EXPECTED_RESULT_SKIP
Definition: ztest_test_new.h:39